像素
AMOLED公司
薄膜晶体管
计算机科学
阈值电压
卷积(计算机科学)
补偿(心理学)
电子线路
逻辑门
电子工程
降级(电信)
有机发光二极管
电压
晶体管
人工智能
材料科学
电气工程
算法
有源矩阵
工程类
电信
人工神经网络
复合材料
心理学
图层(电子)
精神分析
作者
Shiyu Xia,Longda Zhou,Kewei Wang,Xiaobin Fan,Yongkang Xue,Qi Shan,Hannian Wang,Pengpeng Ren,Zhigang Ji,Ru Huang
标识
DOI:10.1109/irps48228.2024.10529410
摘要
In this paper, we developed a new convolution-based methodology to estimate the dynamic time-evolutionary degradation of pixel circuits in display applications. This method not only facilitates more precise circuit-level estimation but also considers the dynamic voltage stress encountered in pixel circuit operations. For the first time, we have enabled realtime observation of the threshold voltage changes over time in key driving TFTs under different bias conditions in transient simulations of pixel circuits. Additionally, we introduce an optimized 9T2C pixel compensation circuit. Compared to the classic 7T1C pixel circuit, our proposed 9T2C circuit compensates for the OLED current degradation caused by DTFT (driving TFT) degradation during the emission phase, reducing the current disparity to 0.39 μA at 1 second. This is an approximately 50% improvement over the 0.73 μA observed in the 7T 1C configuration.
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