碳化硅
材料科学
绝缘体(电)
碳化物
工程物理
复合材料
工程类
作者
L. Di Cioccio,F. Letertre,Y. Le Tiec,A.M. Papon,C. Jaussaud,M. Bruel
标识
DOI:10.1016/s0921-5107(96)02004-1
摘要
Abstract For the first time silicon carbide on insulator structures (SiCOI) were achieved by the Smart-Cut ® process. These structures were formed on polycrystalline SiC and on silicon substrates. The technological solutions used and the structures obtained are presented in this paper.
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