折反射系统
光学
十字线
镜头(地质)
平版印刷术
消色差透镜
极化(电化学)
光刻
光功率
物理
焦距
光学成像
简单透镜
微透镜
视野
材料科学
数值孔径
计算机科学
图像质量
球差
光学设计
光电子学
入学学生
作者
Bernhard Kneer,Paul Gräupner,Reiner Garreis,Ralph Kläsges,Heiko Feldmann
摘要
To enable optical lithography for sub 55 nm features, ArF immersion lithography requires numerical apertures to be significantly larger than 1 - thus leading to new challenges for optical design. Refractive lens designs are not capable to capture these extreme etendues. Catadioptric lens designs can overcome these fundamental issues by keeping the diameters of the optical materials acceptable. We have studied various catadioptric design approaches. The main criteria used to evaluate the potential of the different solutions include mechanical complexity, reticle compatibility, optical sensitivities, polarization capabilities, image field shape, as well as enabling extendibility to even higher NAs. Our assessment leads us to a new design type called catadioptric in-line design which shows superior performance for high NA systems with NA > 1.1.
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