散粒噪声
GSM演进的增强数据速率
噪音(视频)
凝聚态物理
固体物理学
弹丸
物理
核磁共振
材料科学
计算机科学
光学
电信
人工智能
探测器
图像(数学)
冶金
作者
R. A. Niyazov,I. V. Krainov,D. N. Aristov,V. Yu. Kachorovskii
出处
期刊:Jetp Letters
[Springer Nature]
日期:2024-02-26
卷期号:119 (5): 372-379
标识
DOI:10.1134/s0021364024600186
摘要
The Fano factor, $$\mathcal{F},$$ of the shot noise of the current through the edge states of a two-dimensional topological insulator with contacts of generic type is calculated. A magnetic static defect changes $$\mathcal{F}$$ significantly. For metallic contacts, as the strength of the defect increases, the Fano factor increases from $$\mathcal{F} = 0$$ to its maximum value, $${{\mathcal{F}}_{{{\text{max}}}}} \approx 0.17,$$ and then decreases back to zero value in the limit of strong defect. For tunnel contacts in the limit of weak tunnel coupling, the Fano factor is insensitive to the strength of the defect: $$\mathcal{F} \to 1{\text{/}}2.$$ For weak but finite tunnel coupling strength, $$\mathcal{F}$$ exhibits a periodic series of sharp peaks of small amplitude as a function of the magnetic flux piercing the sample. The peaks transform into Aharonov–Bohm harmonic oscillations with increasing the strength of the tunnel coupling.
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