平面的
材料科学
制作
PMOS逻辑
双闸门
短通道效应
CMOS芯片
光电子学
MOSFET
负偏压温度不稳定性
逻辑门
阈值电压
晶体管
电气工程
NMOS逻辑
金属浇口
电压
计算机科学
工程类
病理
替代医学
计算机图形学(图像)
医学
作者
Xuejue Huang,Wen‐Chin Lee,C. Kuo,Digh Hisamoto,Leland Chang,J. Kedzierski,Erik Anderson,Hideki Takeuchi,Yang‐Kyu Choi,K. Asano,Vivek Subramanian,Tsu‐Jae King,Jeffrey Bokor,Chenming Hu
出处
期刊:International Electron Devices Meeting
日期:2003-01-22
卷期号:: 67-70
被引量:369
标识
DOI:10.1109/iedm.1999.823848
摘要
High performance PMOSFETs with gate length as short as 18-nm are reported. A self-aligned double-gate MOSFET structure (FinFET) is used to suppress the short channel effect. A 45 nm gate-length PMOS FinEET has an I/sub dsat/ of 410 /spl mu/A//spl mu/m (or 820 /spl mu/A//spl mu/m depending on the definition of the width of a double-gate device) at Vd=Vg=1.2 V and Tox=2.5 nm. The quasi-planar nature of this variant of the double-gate MOSFETs makes device fabrication relatively easy using the conventional planar MOSFET process technologies. Simulation shows possible scaling to 10-nm gate length.
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