种质资源
生物
栽培
农学
条锈菌
条锈病
Rust(编程语言)
抗性(生态学)
普通小麦
园艺
植物抗病性
基因
遗传学
染色体
程序设计语言
计算机科学
作者
Meinan Wang,Xianming Chen,Liangsheng Xu,Peng Cheng,Harold E. Bockelman
标识
DOI:10.3198/jpr2011.05.0261crg
摘要
Seventy common spring wheat ( Triticum aestivum subsp. aestivum L.) germplasm lines (Reg. No. GP‐873, PI 660056—Reg. No. GP‐942, PI 660125) that are resistant to stripe rust (caused by Puccinia striiformis f. sp. tritici ) were developed from crosses of 66 common and 4 durum [ T. turgidum subsp. durum (Desf.) Husn.] wheat lines originating from 28 countries. Among the new lines, 4 have all‐stage resistance that is effective against the currently predominant races in the United States, 11 have high‐temperature adult‐plant (HTAP) resistance, 13 have effective all‐stage resistance and possibly HTAP resistance, and 42 have HTAP resistance and ineffective all‐stage resistance. Based on their origins and reactions to stripe rust, the majority of the 70 lines may have different genes for stripe rust resistance. These lines were also selected for their relatively good agronomic traits, such as excellent tillering, plump spikes, lodge resistance, proper height, and early maturity and should be useful in diversifying resistance genes used in breeding programs for developing wheat cultivars with stripe rust resistance.
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