极紫外光刻
抵抗
计算机科学
介绍(产科)
钥匙(锁)
供应链
纳米技术
系统工程
材料科学
工程类
计算机安全
业务
医学
图层(电子)
放射科
营销
作者
Andrew Grenville,Benjamin L. Clark,Peter De Schepper,Michael K. Kocsis,Jason K. Stowers,Alan J. Telecky
出处
期刊:
[SPIE]
日期:2020-03-24
卷期号:: 34-34
被引量:3
摘要
In response to the growing demand for Inpria MOx EUV resists, we have brought online our high-volume manufacturing (HVM) production line, have built the necessary supporting qualified supply chain and have developed the associated quality systems. In this paper we will discuss challenges we overcame in scaling and will review data demonstrating new achievements in reproducibility and stability of MOx photoresists. We will also present recent advances in integrated patterning capabilities for specific use cases of Inpria resists in logic and memory applications on the NXE:3400 as well as an update of resist performance on the EUREKA MET5.
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