18‐4: A Novel Methodology for Evaluating Corrosion Failure Risk of OLED Panels

This work suggests a novel methodology for corrosion failure risk detection of OLED panels for the first time. Corrosion on OLED devices is one of the major quality issues, which negatively affect the long‐term reliability of the OLED panels. As the screen size and pixel resolution increase, corrosion failure issues have become the most detrimental quality problem for OLED devices. Corrosion failure itself is a well‐known electrochemical reaction phenomenon under high humidity and electrical potential load. For its catastrophic effect on device long‐term reliability, lots of research has been performed for many years. Still proper methodologies for corrosion failure risk assessment have not been developed due to its complicated electrochemical behaviors. This study identifies three key factors contributing to corrosion failure in OLED devices: (1) moisture penetration through organic layers, (2) anodic oxidation of electrodes influenced by voltage polarity under high‐temperature and high‐humidity conditions, and (3) internal electrode connections to the panels. To assess the corrosion failure risk in OLED panels, we propose an integrated electromagnetic and circuit simulation methodology to rapidly evaluate corrosion failure risks. Based on the newly developed simulation methodology, robust OLED panel designs are suggested and experimentally verified.