材料科学
成核
基质(水族馆)
缩放比例
化学物理
表面粗糙度
表面扩散
分子束外延
铟
分子动力学
表面光洁度
扩散
薄膜
砷化铟
热的
凝聚态物理
动力学(音乐)
纳米技术
曲面(拓扑)
增长率
动态缩放
温度梯度
岛屿生长
蒸发
结晶学
热涨落
增长模型
过冷
光电子学
砷化镓
单层
晶体生长
标识
DOI:10.1002/pssb.202500262
摘要
The present study explores the effect of substrate temperature on the growth of InAs/graphene films grown via molecular beam epitaxy. Increasing substrate temperature leads to thicker film deposition, attributed to changes in thermal accommodation, sticking coefficient, adsorption–desorption dynamics of adatoms, and surface kinetics. This is facilitated by the increased diffusion length of adatoms at higher temperatures, allowing for larger coverage areas before nucleation and island formation occur. While roughness scaling exponents remain consistent at 330 and 360 °C, a significant deviation is observed at 400 °C, indicating a departure from expected power‐law behavior in the height–height correlation function. Additionally, the interface width expands with rising temperature, while the lateral correlation length remains relatively stable. These findings provide insights into optimizing the thin film growth for indium arsenide (InAs) onto graphene, emphasizing the intricate relationship between temperature, growth mechanisms, and surface properties. Understanding these dynamics is essential for leveraging the unique properties of InAs/graphene in future device applications.
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