光学
显微镜
各向同性
图像处理
图像质量
分辨率(逻辑)
材料科学
点扩散函数
图像分辨率
图像(数学)
物理
计算机视觉
计算机科学
人工智能
作者
Yong Hu,Ge Wu,Dongzhi Chen,Yang Tao,Liang Liao,Z. C. Tu,NI XIAOLU,Rong Wan,Qiuqiang Zhan,Zewei Luo,Tongsheng Chen
出处
期刊:Optics Letters
[Optica Publishing Group]
日期:2025-03-20
卷期号:50 (7): 2461-2461
被引量:1
摘要
Super-resolution structured illumination microscopy (SR-SIM) performs spectral expansion of high-frequency information encoded in stripe patterns. However, using a limited number of pattern orientations (typically three) results in a petal-like frequency spectrum, leading to structural and intensity fidelity degradation in reconstructed images. In this Letter, we propose an integrated spatial-frequency domain SIM reconstruction method that enables isotropic spectrum expansion, called ISO-SIM. ISO-SIM overcomes structural artifacts caused by an anisotropic spectral expansion in traditional SIM imaging. We demonstrate the feasibility and fidelity of ISO-SIM through simulations, Argolight slide, and live-cell imaging. ISO-SIM enhanced structural similarity and reduced the error in the mean intensity ratio at certain spatial frequencies compared to Wiener-SIM. We further applied ISO-SIM to live-cell quantitative FRET imaging. ISO-SIM-FRET ensured that the measured FRET efficiency matched the ground truth, with a 19% reduction in the standard deviation compared to Wiener-SIM-FRET, maintaining intensity fidelity and enhancing the accuracy of quantitative analysis while suppressing artifacts.
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