焊接
可靠性(半导体)
电迁移
胡须
电子包装
小型化
材料科学
数码产品
铅(地质)
可靠性工程
机械工程
冶金
工程类
复合材料
电气工程
纳米技术
功率(物理)
物理
量子力学
地貌学
地质学
作者
Nan Jiang,Liang Zhang,Zhi‐Quan Liu,Lei Sun,Weimin Long,Peng He,Mingyue Xiong,Meng Zhao
标识
DOI:10.1080/14686996.2019.1640072
摘要
Electronic products are evolving towards miniaturization, high integration, and multi-function, which undoubtedly puts forward higher requirements for the reliability of solder joints in electronic packaging. Approximately 70% of failure in electronic devices originates during the packaging process, mostly due to the failure of solder joints. With the improvement of environmental protection awareness, lead-free solder joints have become a hot issue in recent years. This paper reviews the research progress on the reliability of lead-free solder joints and discusses the influence of temperature, vibration, tin whisker and electromigration on the reliability of solder joints. In addition, the measures to improve the reliability of solder joints are analyzed according to the problems of solder joints themselves, which provides a further theoretical basis for the study of the reliability of solder joints of electronic products in service.
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