光学
校准
相(物质)
空间频率
材料科学
物理
量子力学
作者
Xiaodong Xun,Robert W. Cohn
出处
期刊:Applied optics
[The Optical Society]
日期:2004-12-10
卷期号:43 (35): 6400-6400
被引量:114
摘要
A new 512 × 512 pixel phase-only spatial light modulator (SLM) has been found to deviate from being flat by several wavelengths. Also, the retardation of the SLM relative to voltage varies across the device by as much as 0.25 wavelength. The birefringence of each pixel as a function of address voltage is measured from the intensity of the SLM between crossed polarizers. To these responses are added a reference spatial phase measured by phase shifting interferometry for a single address voltage. Fits to the measured data facilitate the compensation of the SLM to a root-mean-square wave-front error of 0.06 wavelength. The application of these corrections to flatten the full aperture of the SLM sharpens the focal plane spot and reduces the distortion of computer-designed diffraction patterns.
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