Testable design of RMC networks with universal tests for detecting stuck-at and bridging faults
作者
Bhargab B. Bhattacharya,B. Gupta,Sayantika Sarkar,A. K. Choudhury
出处
期刊:IEE proceedings [Institution of Electrical Engineers] 日期:1985-01-01卷期号:132 (3): 155-155被引量:25
标识
DOI:10.1049/ip-e.1985.0022
摘要
In the paper we investigate whether the function-independent test set for detecting single stuck-at faults in networks realising Reed-Muller canonic (RMC) expansions of switching functions is sufficient to detect all bridging faults in such networks. The investigation, however, reveals its insufficiency, and to circumvent this we propose a technique of augmenting the network with some additional observation points, so that a universal test set can be designed for detecting bridging faults as well.