晶片键合
阳极连接
薄脆饼
微电子机械系统
材料科学
模具准备
表面粗糙度
引线键合
直接结合
胶粘剂
图层(电子)
光电子学
制作
晶圆回磨
粘接
复合材料
纳米技术
晶片切割
电气工程
工程类
炸薯条
替代医学
病理
医学
作者
Shawn Cunningham,Mario Kupnik
出处
期刊:MEMS reference Shelf
日期:2011-01-01
卷期号:: 817-877
被引量:10
标识
DOI:10.1007/978-0-387-47318-5_11
摘要
Wafer bonding is an integral part of the fabrication of MEMS, optoelectronics, and heterogeneous wafer stacks, including silicon-on-insulator. Wafer bonding can be divided into two technological groups: direct bonding and intermediate layer bonding. Direct bonding relies on the cohesive bond that is formed when the surfaces of two wafers are brought together under specific temperature and pressure conditions. Direct bonding relies on critical parameters such as surface energy, surface roughness, and surface morphology. Intermediate layer bonding relies on the cohesive bond that is formed when the surfaces of two wafers are mated with an intermediate layer. The intermediate layer can be an adhesive, polymer, solder, glass frit, or metal. Surface roughness and topography are less critical for bonding with an intermediate layer. Wafer bonding has found application in MEMS to fabricate MEMS devices, to encapsulate the MEMS device in an hermetic environment, and to transfer bond a complete MEMS device to a wafer with integrated circuits. Wafer bonding has found its earliest applications for pressure sensors and accelerometers, but the applications remain boundless.
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