材料科学
二硫化钼
兴奋剂
光电子学
晶体管
钼
阈值电压
阈下传导
杂质
化学气相沉积
纳米技术
半导体
化学工程
盐酸
无机化学
离子
电压
电极
薄膜晶体管
氧化物
锗
溶解过程
钝化
沉积(地质)
场效应晶体管
作者
Jieya Shang,Xiangqi Dong,Shicheng Zeng,HaoJie Chen,Xinliu He,Yuchen Tian,Yufei Song,Zhejia Zhang,Z X Sun,Shuwen Shen,X Y Zhou,Chao Liu,Mingrui Ao,Zhu Y,Hu Y,Qicheng Sun,Jinshu Zhang,Yi-Xiang Wang,Xinrong Shan,Jingde Xu
摘要
ABSTRACT Molybdenum disulfide (MoS 2 ) synthesized via Chemical Vapor Deposition (CVD) holds great potential for next‐generation electronic and optoelectronic devices. However, its device performance and stability are often hindered by intrinsic impurities (e.g., sodium ion (Na + ), molybdenum oxide (MoO 3 )) and the unintentional doping introduced during fabrication. In this study, a simple yet efficient hydrochloric acid (HCl) treatment strategy is proposed to simultaneously address these issues. Spectroscopic analyses show that the HCl treatment effectively removes MoO 3 , Na + , and organic residues while also further reducing the intrinsic n‐type doping of MoS 2 and suppressing the additional n‐type doping introduced by the lift‐off process. Consequently, the performance of the fabricated MoS 2 top‐gate transistors is significantly improved, achieving on‐off ratios exceeding 10 7 and a minimum subthreshold swing of 0.176 V/dec. Inverters constructed from these transistors achieve a voltage gain of 90 at a supply voltage of 3 V. Notably, the enhanced performance remains stable for more than 8 weeks. This low‐cost and photolithography‐compatible HCl treatment provides a scalable and robust pathway toward high‐performance two‐dimensional semiconductor devices.
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