期刊:International Tables for Crystallography日期:2006-09-11卷期号:: 710-712被引量:17
标识
DOI:10.1107/97809553602060000614
摘要
An overview of the Rietveld method of analysing powder diffraction data, in which the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile, is provided. The basic theory of Rietveld refinement is described and some problems that may lead to failure of the method are discussed.