光电探测器
材料科学
光电子学
光子学
光探测
硅
硅光子学
波导管
作者
Shayan Parhizkar,Maximilian Prechtl,Anna Lena Giesecke,Stephan Suckow,Sebastian Lukas,Oliver Hartwig,Arne Quellmalz,Kristinn B. Gylfason,Daniel Schall,Georg S. Duesberg,Max C. Lemme
出处
期刊:Device Research Conference
日期:2021-06-20
被引量:1
标识
DOI:10.1109/drc52342.2021.9467238
摘要
Low cost, easily integrable photodetectors for silicon photonics are still a bottleneck for photonic integrated circuits. Platinum diselenide (PtSe 2 ) is a two-dimensional (2D) transition metal dichalcogenide that has a band gap in the mid-infrared range in mono- and bilayer form and becomes semi metallic as a multilayer material [1] . Multilayer PtSe 2 can be utilized for infrared photodetection [2] . One of its major assets, in particular when it comes to photonics integration, is that it can be grown at Back-end-of-line (BEOL) CMOS compatible temperatures on various substrates using thermally assisted conversion (TAC) [3] , [4] . Here, we demonstrate PtSe 2 photodetectors grown directly on silicon (Si) photonic waveguides at low temperature and compare their performance to PtSe 2 photodetectors fabricated by typical 2D layer transfer at a wavelength of λ = 1550 nm.
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