High temperature Seebeck coefficient and resistance measurement system for thermoelectric materials in the thin disk geometry

A versatile apparatus to measure the cross-plane Seebeck coefficient and the resistivity of bulk samples shaped as disks or thin plates, over a temperature range of 300 K-620 K with possible extension to higher temperatures, is presented. It is constructed from readily available equipment and instrumentation with parts that are easily manufactured. The Seebeck coefficient is measured over an average region of the sample under steady-state conditions. The sample resistance is measured using a four-point alternating current method and scaled to room temperature measurements with known geometry to calculate resistivity. A variety of sample shapes are supported. Most importantly, the support of the thin disk geometry allows for the very same samples to be used in a laser flash instrument. The design allows for rough vacuum, high vacuum, or purging with inert gases in the sample chamber. Measurements on thermoelectric ZnSb and a Ni reference material are presented.