Enhanced effects with scanning force microscopy

We present a general theory that describes the operation of scanning force microscopy in the contact force regime. We find that force derivatives along the surface of a sample produce images that can be dramatically enhanced relative to those of surface topography. For scanning tunneling microscopy atomic force microscopy (STM/AFM) and AFM configurations, the spring constant of the cantilever and the force derivatives perpendicular to the surface of the sample determine the enhancement, respectively.