蚀刻(微加工)
等离子体刻蚀
反应离子刻蚀
等离子体
体积流量
干法蚀刻
过程(计算)
材料科学
硅
化学
纳米技术
光电子学
机械
计算机科学
物理
核物理学
操作系统
图层(电子)
作者
B. N. Chapman,Tamara Hansen,V. J. Minkiewicz
摘要
One of the problems in the understanding and implementation of the plasma etching process is the general lack of quantitative information about the effect of the many process parameters involved. We have been studying the effect of gas flow rates in the etching of silicon materials in fluorocarbon gases, and have been led to define a utilization factor to describe the extent to which the reaction gas is converted to volatile products of the plasma etching process. The experimental evidence for the importance of a utilization factor in plasma etching is shown, and some of the surprisingly many ways in which flow rates influence the whole etching process are illustrated.
科研通智能强力驱动
Strongly Powered by AbleSci AI