Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping (Small 37/2021)

Kelvin Probe Force Microscopy In article number 2102495, Xiaoji G. Xu and co-workers introduce a novel approach to surface potential imaging with tapping mode Kelvin probe force microscopy without the need for an external AC driving voltage – fully compatible with photoinduced force microscopy for multimodal nano-imaging.