逐次逼近ADC
转换器
电容器
计算机科学
采样(信号处理)
功率(物理)
CMOS芯片
有效位数
电子工程
频道(广播)
物理
计算机硬件
电压
电气工程
工程类
电信
探测器
量子力学
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2019-01-04
卷期号:54 (5): 1446-1454
被引量:54
标识
DOI:10.1109/jssc.2018.2886327
摘要
Compared to pipelined analog-to-digital converters (ADCs), pipelined- successive approximation register (SAR) ADCs have been actively explored for better energy efficiency in recent years. Nonetheless, the pipelined-SAR architecture inherently limits the sampling speed of the ADC due to the slow operation of the first SAR ADC, which becomes an increasingly important limitation with the recent expansion of high-speed applications. In this paper, we introduce our new design of a pipelined-SAR ADC to enable faster speed. New loop-unrolled architecture with the split capacitor is used for the first SAR ADC to improve the speed. A resistive open-loop multiplying digital-to-analog converter with a new calibration scheme is designed to reduce the power consumption at high speed. As a result, the 65-nm design can achieve 300-MS/s sampling rate with a single channel. It is among the fastest pipelined-SAR ADC design so far. The peak signal-to-noise-and-distortion ratio is 63.6 dB with a 10-MHz input. It consumes 12.5-mW power from a 1.2-V supply to achieve a power efficiency of 34 fJ/conversion-step.
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