电荷(物理)
探测器
像素
计算机科学
物理
光学
粒子物理学
作者
X. Xie,R. Barten,A. Bergamaschi,B. Braham,Martin Brückner,M. Carulla,R. Dinapoli,Simon Ebner,K. Ferjaoui,D. Greiffenberg,S. Hasanaj,Julian Heymes,V. Hinger,Tsu‐Jae King,Paweł Kozłowski,C. Lopez-Cuenca,D. Mezza,Κωνσταντίνος Μουστάκας,A. Mozzanica,Kirsty A. Paton
标识
DOI:10.1088/1748-0221/19/10/c10007
摘要
Abstract To enhance the spatial resolution of the MÖNCH 25 µm pitch hybrid pixel detector, deep learning models have been trained using both simulation and measurement data. Challenges arise when comparing simulation-based deep learning models to measurement-based models for electrons, as the spatial resolution achieved through simulations is notably inferior to that from measurements. Discrepancies are also observed when directly comparing X-ray simulations with measurements, particularly in the spectral output of single pixels. These observations collectively suggest that current simulations require optimization. To address this, the dynamics of charge carriers within the silicon sensor have been studied using Monte Carlo simulations, aiming to refine the charge transport modeling. The simulation encompasses the initial generation of the charge cloud, charge cloud drift, charge diffusion and repulsion, and electronic noise. The simulation results were validated with measurements from the MÖNCH detector for X-rays, and the agreement between measurements and simulations was significantly improved by accounting for the charge repulsion.
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