Measurement of GaN/Ge(001) Heterojunction Valence Band Offset by X-Ray Photoelectron Spectroscopy
作者
Yan Guo,Liu Xiang-Lin,Song Hua-Ping,Yang An-li,Zheng Gao-Lin,Hongyuan Wei,Shaoyan Yang,Qinsheng Zhu,Wang Zhan-Guo
出处
期刊：Chinese Physics Letters [Institute of Physics] 日期：2010-06-01卷期号：27 (6): 067302-067302被引量：9
标识
DOI：10.1088/0256-307x/27/6/067302
摘要
Measurement of GaN/Ge(001) Heterojunction Valence Band Offset by X-Ray Photoelectron Spectroscopy, Guo Yan, Liu Xiang-Lin, Song Hua-Ping, Yang An-Li, Zheng Gao-Lin, Wei Hong-Yuan, Yang Shao-Yan, Zhu Qin-Sheng, Wang Zhan-Guo
PDF的下载单位、IP信息已删除
(2025-6-4)
学术雷锋
无极微光
null
DW
aaaa
高高高
Mm11
秋风
maxiaole
乐空思
aajhajkahna
吃葡萄不吐葡萄皮
HFH
嘻嘻哈哈
v0id
Aszlz
初景
shen
lx
极限001
皖公网安备34019202002308
