Photo-induced defects in MAPbBr3 single crystals

Single crystals of hybrid organic–inorganic halide perovskite have exhibited significantly good stability and a low trap density, leading to advantageous applications in optoelectronics. Even with recent development of high-quality perovskite single crystals, a defect analysis should be addressed to improve device performance in addition to understand the interaction between photo-generated carriers and defects. In this paper, we present a photo-induced defect characterization of CH 3 NH 3 PbBr 3 (MAPbBr 3 ) perovskite single crystals using an interpretation of photo-current and photo-capacitance measurement. The bulk and the interfacial defect densities of MAPbBr 3 crystals with a gold electrode are examined by the characterization of photo-capacitive response under three different wavelengths of light. The transient photo-response of the single crystals reveals the occurrence of carrier trapping and a recombination process. The photo-response under the various light conditions provides a possible origin of defects in MAPbBr 3 single crystals. Our comprehensive optoelectronic analysis provides the establishment of the link between the carrier transport and device performance depending on the illuminations. The fundamental understanding of photo-induced defects in perovskites can be helpful to realize the origin of electrical loss and develop highly efficient optoelectronic devices.