材料科学
钙钛矿(结构)
离子
微晶
检出限
探测器
灵敏度(控制系统)
X射线
纳米技术
光电子学
化学工程
计算机科学
光学
电子工程
化学
物理
电信
工程类
有机化学
色谱法
冶金
作者
Jingda Zhao,Xin Wang,Qi Cheng,Yubing Xu,Yuzhu Pan,Yuwei Li,Zhiwei Zhao,Zhuoya Zhu,Jing Chen,Jun Wu,Qing Li,Jianming Zhou,Byung Seong Bae,Gabby Sarusi,Ying Zhu,Xiaobao Xu,Wei Lei,Xiaobing Zhang
出处
期刊:Small
[Wiley]
日期:2024-03-29
卷期号:20 (33)
标识
DOI:10.1002/smll.202311649
摘要
X-ray detection and imaging are widely used in medical diagnosis, product inspection, security monitoring, etc. Large-scale polycrystalline perovskite thick films possess high potential for direct X-ray imaging. However, the notorious problems of baseline drift and high detection limit caused by ions migration are still remained. Here, ion migration is reduced by incorporating 2D perovskite into 3D perovskite, thereby increasing the ion activation energy. This approach hinders ion migration within the perovskite film, consequently suppressing baseline drift and reducing the lowest detection limit(LOD) of the device. As a result, the baseline drifting declines by 20 times and the LOD reduces to 21.1 nGy s
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