薄脆饼
材料科学
钻石
晶片键合
光电子学
半导体
化学气相沉积
聚晶金刚石
微晶
工程物理
复合材料
冶金
工程类
作者
Tadatomo Suga,Junsha Wang,Kazuya Yamamura,I. Kataoka
标识
DOI:10.1109/ectc51529.2024.00319
摘要
To achieve the room temperature bonding of CVD polycrystalline diamond wafers to other semiconductor or piezoelectric single crystalline wafers, plasma assisted polishing (PAP) combined with gas cluster ion beam (GCIB) irradiation was firstly proposed to polish diamond wafers. Using this new polishing method, the peak-to-valley (Pv) value and root-mean-square (RMS) surface roughness of 2-inch polycrystalline diamond wafers were controlled to within 3 µm and 1 nm, respectively. The polished 2 inch diamond wafers were for the first time successfully bonded to 4 inch LiNbO 3 and 2 inch GaN wafers at room temperature using surface activated bonding (SAB) with Si nano-adhesion layer.
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