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0 积分 2024-11-15 加入
Effect of Nitrogen on the Physical Properties and Work Function of MoNxCap Layers on HfO2Gate Dielectrics
6个月前
已完结
Hot Carrier Injection Reliability of Fabricated N- and P-Type Multi FinFETs with Different TiN Stacks
6个月前
已完结
Hot-carrier charge trapping and trap generation in HfO2 and Al2O3 field-effect transistors
6个月前
已完结
The Role of Carrier Injection in the Breakdown Mechanism of Amorphous Al2O3 Layers
6个月前
已完结
The Impact of Hot Carrier Injection-Induced Device Degradation for Lower-Power FinFETs
6个月前
已完结
Effect of Device Dimensions, Layout and Pre-Gate Carbon Implant on Hot Carrier Induced Degradation in HKMG nMOS Transistors
6个月前
已完结
Suppressing the hot carrier injection degradation rate in total ionizing dose effect hardened nMOSFETs
6个月前
已完结
Impact of Fin Width and Back Bias Under Hot Carrier Injection on Double-Gate FinFETs
6个月前
已完结
Oxide reliability of drain engineered I/O NMOS from hot carrier injection
6个月前
已完结
Physical understanding of hot carrier injection variability in deeply scaled nMOSFETs
6个月前
已完结
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