Lv4
470 积分 2025-10-10 加入
Hole Mobility in Si(110) p-MOS Transistors
3天前
已完结
Hole Mobility in Accumulation Mode Metal–Oxide–Semiconductor Field-Effect Transistors
5天前
已关闭
Effects of $\hbox{Al}_{2}\hbox{O}_{3}$ Dielectric Cap and Nitridation on Device Performance, Scalability, and Reliability for Advanced High- $\kappa$/Metal Gate pMOSFET Applications
5天前
已完结
Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction
5天前
已完结
ALD metal-gate/high-κ gate stack for Si and Si/sub 0.7/Ge/sub 0.3/ surface-channel pMOSFETs
5天前
已完结
Effects of $\hbox{Al}_{2}\hbox{O}_{3}$ Dielectric Cap and Nitridation on Device Performance, Scalability, and Reliability for Advanced High- $\kappa$/Metal Gate pMOSFET Applications
5天前
已完结
The role of Si orientation and temperature on the carrier mobility in metal oxide semiconductor field-effect transistors with ultrathin HfO2 gate dielectrics
5天前
已完结
Carrier mobility in advanced CMOS devices with metal gate and HfO2 gate dielectric
5天前
已完结
ALD metal-gate/high-κ gate stack for Si and Si/sub 0.7/Ge/sub 0.3/ surface-channel pMOSFETs
5天前
已完结
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