| 标题 |
Enabling Non-Destructive Testing Through Fully Spectral X-Ray Diffraction with Timepix3 Detectors |
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| DOI | |
| 其它 |
期刊:2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) 作者:R. Nebel; J. Jakůbek; A. Novák; T. Komárek 出版日期:2025-11-01 |
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(2025-6-4)