| 标题 |
Defect Analysis of Rare‐Earth (Y, La, Sm) Oxide Doped AlN Ceramics for Electronic Device Applications |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of the American Ceramic Society 作者:Bowen Yin; Haoran Ren; Weijia Guo; Chongyang Zhang; Xingchen Zhang; et al 出版日期:2026-03-01 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)