| 标题 |
Degradation of a-IGZO Thin-Film Transistors Under Negative Bias and Illumination Stress in the Time Span of a Few Seconds |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Electron Device Letters 作者:Y.-H. Tai; H.-W. Liu; P.-C. Chan; S.-L. Chiu 出版日期:2018-05-01 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)