| 标题 |
Understanding the Competitive Interaction in Leakage Mechanisms for Effective Row Hammer Mitigation in Sub-20 nm DRAM |
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| DOI | |
| 其它 |
期刊:IEEE Electron Device Letters 作者:Jie Li; Longda Zhou; S. Ye; Zheng Qiao; Zhigang Ji 出版日期:2023-11-28 |
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(2025-6-4)