| 标题 |
A practical guide to electrical characterization of interface states: Case studies on SiC and GaN |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Zilan Wang; Hongling Wu; Haoyang Li; Jiaxuan Yang; Francis C.C. Ling; Lai Wang 出版日期:2025-09-18 |
| 求助人 | |
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(2025-6-4)