| 标题 |
A Semiempirical Physics-Based Model for Threshold Voltage Degradation in Amorphous InGaZnO Thin-Film Transistors under Linear and Saturation Stress Conditions |
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| DOI | |
| 其它 |
期刊:ACS Applied Electronic Materials 作者:Hassan Ul Huzaibi; Pengfei Liu; Guanming Zhu; Waseem Akram; Muhammad Faizan; et al 出版日期:2026-07-24 |
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(2025-6-4)