| 标题 |
Reliability failure induced by the Si epitaxy growth on PMOS high voltage oxide in 0.15/spl mu/m embedded flash memory devices |
| 网址 | |
| DOI | |
| 其它 |
期刊:Proceedings. IEEE Computational Systems Bioinformatics Conference 作者:S. Han; N. Kim; D. Son; M. Mukhopadhyay; Wing Yew Wong; et al 出版日期:2004-11-15 |
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(2025-6-4)