| 标题 |
Demonstration of a Wafer Level Face- To-Back (F2B) Fine Pitch Cu-Cu Hybrid Bonding with High Density TSV for 3D Integration Applications |
| 网址 | |
| DOI | |
| 其它 |
期刊:2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) 作者:Jerzy Javier Suarez Berru; Stephane Nicolas; Nicolas Bresson; Myriam Assous; Stephan Borel 出版日期:2023-05-01 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)