| 标题 |
Electrical Physically Unclonable Function via Stochastic-Defect-Driven Invisible Current Pathways |
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| DOI | |
| 其它 |
期刊:ACS Applied Materials and Interfaces 作者:C. Moon; Seong-Han Jeong; J. Oh; Myat Thet Khine; Yanji Piao; et al 出版日期:2026-05-27 |
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(2025-6-4)