| 标题 |
Thermal Interface Resistance Measurement and Degradation Mechanisms of Ti/X (X: Si, Au, Cu) Interfaces |
| 网址 | |
| DOI | |
| 其它 |
期刊:International Conference on Electronic Packaging Technology 作者:Hang Liang; Bingxu Ma; Yu Zhao; Xincheng Zhang; Fengzhi Tang; et al 出版日期:2025-08-05 |
| 求助人 | |
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(2025-6-4)