| 标题 |
Buried Interfacial Engineering with Potassium Hypophosphite to Suppress Ion Migration for Improved and Stabilized Perovskite Photodetectors |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS applied electronic materials 作者:Jianxiang Huang; Huimin Zhang; Huiying Zhu; Chenglin Zhang; Mingming Chen; et al 出版日期:2025-03-30 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)