| 标题 |
Analysis and Testing of Conducted Electromagnetic Susceptibility in Integrated Circuits Based on Multi-Waveform Interference Using BCI |
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| 其它 |
期刊:2024 IEEE 10th International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications (MAPE) 作者:Changshun Fu; Zhaowen Yan; Fuyu Zhao; Kunkun Hu; Ying Chen; Siyi Xing 出版日期:2025-01-01 |
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(2025-6-4)