| 标题 |
Quantum Dot Morphology and Defect Configuration Anisotropy for III-V Laser Material Grown on Patterned Si Photonic Wafers |
| 网址 | |
| DOI |
10.48448/52ek-cp44
doi
|
| 其它 |
期刊:Underline Science Inc. 作者:Electronic Materials Conference 2023; John Bowers; Kaiyin Feng; Eamonn Hughes; Rosalyn Koscica; et al 出版日期:2023-01-01 |
| 求助人 | |
| 下载 | 暂无链接,等待应助者上传 |
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(2025-6-4)