| 标题 |
HV ESD Device Solution Evaluations in 55nm BCD Technology |
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| DOI | |
| 其它 |
期刊:2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 作者:Sagar P Karalkar; Milova Paul; Xiao Mei Elaine Low; Kyong Jin Hwang; Robert Gauthier 出版日期:2021 |
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(2025-6-4)