| 标题 |
Aging behavior, reliability, and failure physics of GaN-based optoelectronic components |
| 网址 | |
| DOI | |
| 其它 |
期刊:Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX 作者:Heonsu Jeon; Li-Wei Tu; Michael R. Krames; Martin Strassburg; Enrico Zanoni; et al 出版日期:2016 |
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(2025-6-4)