| 标题 |
The formation mechanism of grown-in defects in CZ silicon crystals based on thermal gradients measured by thermocouples near growth interfaces |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science and Engineering: B 作者:Takao Abe 出版日期:2002-07-25 |
| 求助人 | |
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(2025-6-4)