| 标题 |
专利、报告等 Etching-to-Deposition Transition in Sio2/Si3n4 Using Chxfy Ion-Based Plasma Etching: An Atomistic Study with Neural Network Potentials |
| 网址 | |
| DOI |
10.2139/ssrn.5374422
doi
|
| 其它 |
期刊: 作者:Hyungmin An; Sangmin Oh; Dongheon Lee; Jae-hyeon Ko; Dongyean Oh; et al 出版日期:2025-08-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)