| 标题 |
Strain engineered C31 field-effect-transistors: a new strategy to break 60 mV/decade by using electron injection from intrinsic isolated states |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Express 作者:Qianwen Wang; Pengpeng Sang; Fei Wang; Wei Wei; Yuan Li; et al 出版日期:2021-06-30 |
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(2025-6-4)