| 标题 |
Insight note: X‐ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer |
| 网址 | |
| DOI | |
| 其它 |
期刊:Surface and Interface Analysis 作者:Alvaro J. Lizarbe; George H. Major; Vincent Fernandez; Neal Fairley; Matthew R. Linford 出版日期:2023-06-01 |
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(2025-6-4)