| 标题 |
Characterization of small-size oxygen precipitates in CZ-silicon by synchrotron Bragg tail analysis |
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| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Tomoyuki Horikawa; Tetsuya Tohei; Akira Sakai; Yoshiyuki Tsusaka; Junji Matsui 出版日期:2026-11-01 |
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(2025-6-4)