| 标题 |
Numerical analysis of defects passivation for tungsten-doped indium oxide thin film transistors by using hydrogen peroxide as cosolvent in a supercritical fluid system |
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| DOI | |
| 其它 |
期刊:Solid-State Electronics 作者:Zeqiu Tang; Kai-Jhih Gan; K. Chang-Liao; Ze-Fu Zhao; Jia-Long Xiang; et al 出版日期:2026-01-01 |
| 求助人 | |
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(2025-6-4)